Abstract
高効率テラヘルツデバイス開発のための第一原理計算に基づくSTMシミュレーションによる低温成長GaAsのバルク点欠陥の直接同定
Full Text
Sign-in/Register to access full text options
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have