Abstract
SUMMARYWe have made scanning tunnelling microscope (STM) studies of the lattice expansion and topography of cleaved crystals of 2H‐NbSe2 which were intercalated in situ with silver ions entering along one edge of the samples. The measurements confirm the high surface mobility of silver seen in earlier electrochemical studies. The expansion measurements made with optimum 2 Å resolution showed no convincing evidence of silver staging domains. Topographic images revealed noisy patches and shallow depressions on cleaved surfaces of intercalated samples. It is suggested that these depressions might represent silver‐poor regions in the first intercalation layer.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
