Abstract
ABSTRACTSTM stimulated light emissions (STM-LE) from cleaved surfaces of GaAs(110) were investigated using a UHV-STM combined with a light detection system. Clean surfaces of Zn doped GaAs (p=5×1018) were obtained by mechanical cleavage in UHV. Light emission from the cleavage surface showed a single peak in a spectrum, which corresponds to luminescence by the conduction band to acceptor level transition in GaAs. In STM image Zn acceptors show bright tri angular-shaped contrasts, while in photon map they show dark contrasts when taken with a sample bias voltage of 2.0 V and 2.2 V at 80K. This contrast can be explained from the local band bending due to the charging effect or strain effect of the Zn acceptor.
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