Abstract
Ultra-soft pseudopotentials plane-wave technique is used to simulate the tip–sample interaction and STM–AFM image formation on TiO 2(1 1 0) 1×1 and 1×2 surfaces. It is shown that the strong tip–oxygen chemical interaction determines the main feature of the AFM image formation. By checking the effects of tip-induced surface relaxation, spin polarization, and bias voltage, we show that it should be the significant tip-induced surface relaxation on the 1×1 surface which leads to the too small image corrugation observed experimentally on the 1×1 surface.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
