Abstract
Infrared spectroscopic ellipsometry (IRSE) and visible monochromatic ellipsometry (VISE) approaches were applied to investigate the chemical structure and thickness of ultrathin polymer films. Mixed polystyrene-poly(2-vinylpyridine) and polystyrene-poly(tert-butyl acrylate) polymer grafted films (mixed brushes) with gradually changing composition (1D gradient mixed brush) along the sample were prepared on a temperature gradient stage via two subsequent "grafting to" reactions. The films were characterized by high-precision mapping VISE at a single wavelength (632.8 nm) and IRSE. The set of 1D IRSE spectra of the polymer brush films obtained by mapping the 1D gradient brush were used to estimate the thickness and the local composition of the film and to construct the 1D map of the film in terms of the chemical composition of the brush. The results were compared with the data obtained using monochromatic ellipsometry where the brush composition was estimated from the results of two subsequent measurements followed each grafting step. The measurements of the brush thickness and composition with both methods were found to be in gratifying agreement. The results demonstrate the high potential of IRSE methods for the one-step characterization (by thickness and chemical composition) of ultrathin polymer films of complex composition.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
