Abstract

Electrical conductivity images of graphite surfaces are routinely obtained using scanning probe microscopy. Although the acquired conductivity maps often display a trigonal pattern with smooth variations, a “stick–slip” type of fluctuation has also been reported, where the local conductivity inversely correlates with the friction force during probe scanning. In this work, we revisit the lattice-resolved variations in local conductivity on graphite surfaces and reveal a new series of behaviors. Unlike previous observations, we demonstrate that local conductivity can exhibit in-phase, out-of-phase, or mixed-mode correlations with “stick–slip” lateral force signals. These behaviors are attributed to the cross-talk effect between interface contact conductivity and lateral force, induced by the inhomogeneous conductivity of the tip apex. This mechanism is experimentally validated, showing that local conductivity variations can switch within a single scan due to spontaneous changes in the conductivity of the tip. Our findings enhance the understanding of lattice-resolved electrical conductivity data on graphite surfaces and suggest a novel approach to amplify small lateral forces using inhomogeneous probe tips.

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