Abstract
Scanning transmission electron microscopy (STEM) images can be limited by either aberrations or, because of the technique's serial acquisition, by the effects of environmental instabilities. MatLab image-processing code was written which performs a two stage process to restore degraded high-resolution high-angle annular dark-field (HAADF) STEM images. Firstly, individual images were analysed to identify and correct for high-frequency scan noise; image resolution and signal-noise ratio (SNR) are used as performance metrics and were improved by up to 11.8% and 49% respectively. Secondly, a focal series was used to identify variations in information transfer as a function of defocus (aberrations) whereafter a single image was reconstructed yielding an increase in resolution and SNR of 9.88% and 205% respectively.
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