Abstract

We perform stimulated emission depletion (STED) microscopy with a novel light source consisting of a fiber-amplified, frequency doubled laser operating with a 1 MHz repetition rate and a 530 nm output coupled into a standard single mode fiber to produce a tunable spectrum of discrete peaks via stimulated Raman scattering (SRS). Using peaks at 585, 600, and 616 nm as STED light we perform STED microscopy with resolution down to 20-30 nm. The nanosecond pulsed light source should prove valuable for all forms of microscopy requiring both brilliance and multiple wavelengths in the visible range.

Highlights

  • Stimulated emission depletion (STED) microscopy is a powerful tool for the sub-diffraction visualization of fluorescent structures in the far field [1], able to make observations#113471 - $15.00 USD Received 26 Jun 2009; revised Aug 2009; accepted Aug 2009; published 20 Aug 2009(C) 2009 OSA noninvasively on the nanoscale to explore subjects as diverse as endoplasmic reticulum dynamics in living cells [2] and the properties of single color-center defects in bulk diamonds [3]

  • We perform stimulated emission depletion (STED) microscopy with a novel light source consisting of a fiber-amplified, frequency doubled laser operating with a 1 MHz repetition rate and a 530 nm output coupled into a standard single mode fiber to produce a tunable spectrum of discrete peaks via stimulated Raman scattering (SRS)

  • The nanosecond pulsed light source should prove valuable for all forms of microscopy requiring both brilliance and multiple wavelengths in the visible range

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Summary

Introduction

Stimulated emission depletion (STED) microscopy is a powerful tool for the sub-diffraction visualization of fluorescent structures in the far field [1], able to make observations#113471 - $15.00 USD Received 26 Jun 2009; revised Aug 2009; accepted Aug 2009; published 20 Aug 2009(C) 2009 OSA noninvasively on the nanoscale to explore subjects as diverse as endoplasmic reticulum dynamics in living cells [2] and the properties of single color-center defects in bulk diamonds [3].

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