Abstract
This paper introduces a special issue entirely devoted to the topic ’Statistics for Microelectronics’. The relevance of the theme for this journal is due to both the primary role that microelectronics has in many business activities of the modern society and to the complexity of the production process of integrated circuits that are obtained by several different steps performed on a wafer (i.e., a thin silicon slice of a few inches of diameter). Advanced statistical methods are necessary to monitor and improve this process because the yield of this industrial manufacturing is typically tiny and requires a very high precision. After a brief review of the semiconductor manufacturing process, we point out how statistical methodologies can contribute to this. Finally, we introduce the papers that discuss some key aspects of this subject. Copyright © 2013 John Wiley & Sons, Ltd.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Applied Stochastic Models in Business and Industry
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
