Abstract
Part 1 Statistical process control: development of SPC what SPC is and is not online SPC methods off-line process control SPC methodolgy other factors affecting the success of SPC. Part 2 Some basic distributions: attribute data countable data geometric distribution the Normal distribution distributions derived from the Normal distribution application of results testing for normality the Normal approximation to the binomial distribution Normal approximation to the Poisson distribution. Part 3 Process variation: reasons for process variation types of process variation some models for process variation sampling error and measurement error. Part 5 Basic Shewhart control charts for continuous variables: control charts for average level charts for control of (within group) process spread the average run length (ARL) special problems some theoretical results for Shewhart charts charts for control of process spread. Part 6 Extensions to Shewhart charts for one-at-a-time data: one-at-a-time sampling estimation of sigma for one-at-a-time data details of further control charts for control of process average level control of process spread choice of charting method practical use of Shewhart and moving average charts properties of EWMA and MA charts. Part 7 Cumulative sum techniques for continuous variables: CuSum charts - for control of average level, for control of process spread nomogram for CuSums. Part 8 Further theoretical results on control charts for continuous variables: the effect of departures from assumption on moments of x and s(2) Shewhart charts - Markov chain approach cumulative Sum charts charts for control of process spread. Part 9 The design of control charts for specification limits: single specification limits - chart for means double specification limits - high capability processes, an alternative approach. Part 10 Control of discrete data processes: Shewhart charts - for countable data (c and u), for attribute data (np and p) CuSum charts for countable data, for attribute data comparison of Shewhart and CuSum schemes. Part 11 Sampling inspection: classification of inspection plans some properties of sampling plans methods of using sampling plans for attributes. Part 12 Inspection by variables: single specification limit - sigma known, sigma unknown estimation of fraction non-conforming, single specification limit double specification limit - sigma known, sigma unknown multivariate sampling plans. Part 13 Standard sampling systems: statement of method for inspection by attributes inspection by variables International Standards for process and quality control. Part 14 Adaptive sampling plans: CSP-1 and the AOQL criterion theory of CSP-1 the AEDL criterion. (Part contents).
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