Abstract
A grating-based Talbot-Lau X-ray interferometer provides three imaging modalities, namely attenuation, differential phase contrast, and dark field. Of these, dark-field imaging is uniquely capable of detecting and characterizing micron-scale fine structure in an object via small-angle scattering that reduces fringe visibility. In Part 1 [Opt. Express 29, 40891 (2021)10.1364/OE.447794], we formulate a statistical optics model that predicts the change in visibility, or dark-field signal, as a function of the statistical properties of the scattering object as well as its location within the interferometer. In Part 2, we demonstrate use of this model by simulating an object comprising a random collection of scattering microspheres placed in an X-ray grating interferometer designed to operate at 28 keV. The statistical optics results are validated by numerical Fourier optics simulations.
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