Abstract
A new method to study the transient detection efficiency (DE) and pulse amplitude of superconducting nanowire single photon detectors (SNSPD) during the current recovery process is proposed — statistically analyzing the single photon response under photon illumination with a high repetition rate. The transient DE results match well with the DEs deduced from the static current dependence of DE combined with the waveform of a single-photon detection event. This proves that static measurement results can be used to analyze the transient current recovery process after a detection event. The results are relevant for understanding the current recovery process of SNSPDs after a detection event and for determining the counting rate of SNSPDs.
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