Statistical analysis of radial interface growth

Abstract

Recent studies have questioned the application of standard scaling analysis to studyradially growing interfaces (Escudero 2008 Phys. Rev. Lett. 100 116101; 2009 Ann. Phys.324 1796). We show that the radial Edwards–Wilkinson (EW) equation belongs to thesame universality as that obtained in the planar geometry. In addition, we use numericalsimulations to calculate the interface width for both random deposition with surfacerelaxation (RDSR) and restricted solid on solid (RSOS) models, assuming that the systemsize increases linearly with time (due to radial geometry). By applying appropriaterules for each model, we show that the interface width increases with time astβ, where theexponent β is the same as those obtained from the corresponding planar geometries.