Statistical analysis of an AGN sample with simultaneous UV and X-ray observations with Swift

Abstract

I report on the statistical analysis of a sample of about 100 AGN with simultaneous UV and Xray observations with Swift. I found clear correlations between the X-ray spectral slope αX, the UV slope αUV, and the optical-to-x-ray spectral slope αoxwith the Eddington ratio L/LEdd. I also report on the bolometric corrections for L0.2−2.0keV and L5100. A major aspect of the statistical analysis is multi-variate analysis statistical tools such as the Principal Component Analysis (PCA) and cluster analysis. This analysis shows that the main driver of the AGN properties in this sample is the Eddington ratio L/LEdd. Although separating Seyfert 1s into NLS1s and BLS1s is a good classification, with the 2000 km s−1 cutoff line it is still arbitrary. A better classification scheme may be to separate AGN into low and high L/LEdd AGN as suggested from the cluster analysis.