Statistical analysis for the long-term electromagnetic compatibility of a DC-DC converter

Abstract

One important objective of the electromagnetic compatibility (EMC) studies is to make the products compliant with the EMC requirement of the customers or the standards. However, all the EMC compliance verifications are applied before the delivery of final products. Will the product still be EMC compliant during the lifetime? If not, what is the risk of non-compliance with EMC requirements, and how long the EMC compliance can be guaranteed? The long-term EMC studies appeared in the recent past. Several works showed that the degradation caused by aging could induce harmful evolution of electromagnetic compatibility. However, due to the dispersion of aging impact, the statistical analysis is needed for the EMC evolution of a group of samples. This paper presents the notion “electromagnetic reliability” (EMR) and the statistical analysis methods of the long-term EMC based on the measurement data. A case study of a DC-DC converter is taken to demonstrate the whole analysis process and the risk prediction.