Abstract
Accelerated degradation test (ADT) provides an effective way to access the reliability of high-reliablity products. In this paper, a doubly accelerated degradation model based on the Wiener process is proposed to characterize the degradation path. An objective Bayesian approach is used to make inferences on the parameters of the model. Important objective priors including the Jeffreys prior and reference priors are derived for the parameters. It is shown that the corresponding posterior distributions are all proper, which implies that these priors enables posterior inferences. A simulation study is adopted to show the effectiveness of the proposed approach. Finally, the model is applied to analyze a real data set.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.