Abstract
This work presents a study of the effect of film thickness on the static and dynamic critical behavior of thin magnetic Ising films. Monte Carlo simulations using the Wolff algorithm were performed to determine the static and dynamic critical exponents of the films. A dimensionality crossover from 2D to 3D (due to the finiteness of the films) in the static and dynamic critical behavior was observed as the film thickness increases. In addition, a slight increase in the effective dimension deff and a considerable increase in the critical temperature Tc(∞) were found. Small values for the dynamic critical exponents were obtained, indicating that the Wolff algorithm is a very efficient method for these magnetic systems.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
