Abstract
The problem of optimal and testable state assignment in PLA-based FSM is discussed. Test sequences generated by a functional test pattern generation method have been used to study the implication of state assignment on the testability of the FSM. Simulation results show that a functional test, generated with no knowledge of the state assignment, allows to obtain almost always a full fault coverage. On the other hand, state assignment algorithm can be modified in order to obtain a shorter test sequence.
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