Abstract
AbstractStandardless synchrotron radiation x‐ray fluorescence (SR‐XRF) and conventional XRF analytical results are presented. The method was applied to determine sample mass thickness. Concentrations of the major constituents of samples were also determined. Small samples (∼30 mg cm−2) were mounted on suitable substrates prepared with a mixture of chemicals. The intensity reduction of fluorescent lines emitted by substrates was analyzed. The choice of the substrate depends on the number of elements to be analyzed, since elemental concentrations are determined through the attenuation of substrate fluorescent lines. Comparative results obtained by using SR and conventional XRF are also presented. Although this method is used to characterize minerals, it may also be applied to several kinds of samples. Copyright © 2002 John Wiley & Sons, Ltd.
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