Abstract
Standard specimens based on Au and ZnO nanoparticles are developed for calibration of low-angle x-ray diffractometers. Structural parameters of the standard specimens obtained are measured by means of transmission electron microscopy. Average values of nanoparticle dimensional parameters are confirmed, and additional characterization of standard specimens is achieved using a set of research methods, including optical spectroscopy, x-ray analysis, and synchrotron radiation.
Published Version
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