Abstract

We investigate the dispersion behavior of localized defect modes supported by a defect layer sandwiched within two symmetric semi-infinite one-dimensional (1D) photonic crystals (PCs) that are made from two or three constituents of dielectric media via an analytic Bloch-mode approach. We analyze two kinds of formation mechanism of defect modes as the photonic band gap effect and total internal reflection effect, and find that defect-mode properties are influenced significantly by the stack sequences of the two semi-infinite background PCs relative to the defect layer. Such investigations allow people to control the defect-mode dispersion behavior and engineer the features of optical devices by simply changing the stack sequences of the background PCs.

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