Abstract
X-ray powder diffraction line profile studies have been made from hcp Ti−Al alloys. A Fourier analysis of the profiles has been used to separate the total broadening into that caused by domain size, mean-square (ms) microstrains, and stacking faults. The stacking fault probability and the ms microstrains of the Ti−Al alloys decrease with increasing aluminum content, whereas the domain size remains relatively constant. This change in stacking fault probability is used to explain the corresponding changes in dislocation structures.
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