Abstract
X-ray powder diffraction line profile studies have been made of filings from hexagonal close-packed silver-tin and silver-indium alloys. The profiles have been analysed by Fourier and line breadth methods to separate the total line broadening into that caused by particle size, lattice strain and the presence of stacking faults. The stacking fault probabilities of the silver-tin alloys are greater than those of the silver-indium alloys. In each alloy system, those alloys whose composition is nearer to the composition of the face-centred cubic phase boundary have the greatest stacking fault density. The stacking fault density is thus dependent upon the relative free energies of the hexagonal and face-centred cubic phases and is not a function of electron concentration.
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