Abstract
The quasi Fermi level for electrons in a soft perovskite crystalline thin film and the contact qualities at the PCBM/perovskite and perovskite/P3CT-Na interfaces can be increased using a facile encapsulation method, which improves the device performance and stability of the resultant perovskite solar cells. In the encapsulated perovskite solar cells, the averaged open-circuit voltage (VOC) largely increases from 0.981 V to 1.090 V after 9 days mainly due to the increased quasi Fermi levels. Besides, the reflectance and photoluminescence (PL) spectra show improved contact qualities at the PCBM/perovskite and perovskite/P3CT-Na interfaces, which can be used to explain the increase in the short-circuit current density (JSC) from 21.68 mA cm-2 to 23.48 mA cm-2 after the encapsulation process. Besides, nanosecond time-resolved PL and temperature-dependent PL spectra can be used to explain the increased VOC, which is mainly due to the increased shallow defect density and thereby increasing the exciton binding energy of the encapsulated perovskite sample. It is noted that the averaged power conversion efficiency (PCE) slowly decreases from 18.24% to 16.52% within 45 days.
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