Abstract
Deuteron magnetic resonance measurements on high quality a-Si:H,D films reveal three principal features: a sharp 66 kHz quadrupolar Pake doublet corresponding to silicon-bonded D passivating dangling bonds, a broad central line which has been shown to arise primarily from relatively isolated D 2 and HD molecules in nanovoids, and a small narrow central line arising from mobile molecular D 2 and HD in greater than 3 Å microvoids. The results of measurements on high quality plasma-deposited partially deuterated amorphous silicon cyclically exposed to a 2 h 150°C dark anneal and a 36 h photoillumination at 0.5 W/cm 2 with a 400–700 nm xenon are lamp are described. The spectra show that, following an initial spin-lattice relaxation-related transient, the intensities of all three components of the deuterium may vary by less than 1% upon illumination or dark anneal. The broad central line, primarily from isolated molecules, shows a small diamagnetic shift upon illumination. The shift becomes strongly paramagnetic at short magnetization recovery times following radio frequency saturation. The SiD doublet and the small narrow central line do not shift appreciably. This absence strongly suggests that Staebler-Wronski magnetic changes are remote from the environments of most of the silicon bonded hydrogen.
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