Abstract
Resonant rotary clocking is a low-power clocking technology for multi-phase clock generation in GHz frequency range. In this paper, Rotary Traveling Wave Oscillators (RTWOs) are analyzed under process variations and negative bias temperature instability (NBTI) at the 90nm technology node. The analysis is focused on 1) variations in the physical geometries of the rotary ring, 2) inter and intra-die transistor variations, 3) power supply fluctuation and 4) NBTI. Monte-Carlo based analysis are performed to study the effects of process variations and transistor aging on the operating frequency and power consumption of the rotary ring at a temperature of 110° C. SPICE based simulations show natural robustness against process variations, and NBTI.
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