Abstract
The major problem of measurement of a power spectral density (PSD) distribution of surface heights with surface profilometers arises due to the unknown modulation transfer function (MTF) of the instruments, which tends to distort the PSD at higher spatial frequencies. The special mathematical properties of binary pseudo-random patterns make them an ideal basis for developing MTF calibration test surfaces. Two-dimensional binary pseudo-random arrays have been fabricated and used for the MTF calibration of the MicroMap TM -570 interferometric microscope with all available objectives. An investigation into the effects of fabrication imperfections on the quality of the MTF calibration and a procedure for accounting for such imperfections are presented.
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