Abstract
ABSTRACTInterfacial chemistry at indium tin oxide/polymer interfaces is of fundamental importance for the performance of polymer-based light emitting diodes. X-ray photoelectron spectroscopy and Rutherford backscattering spectrometry are used to investigate the stability of the interface formed between indium tin oxide and (i) the light emitting polymer poly(p-phenylenevinylene), and (ii) the hole injecting layer poly(3,4-ethylenedioxythiophene) polystyrenesulfonate. The formed interfaces are not stable and indium-containing species diffuse from the metal oxide surface into the polymer layers.
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