SRAM Memory Built in Self-Test using MARCH Algorithm

Abstract

Semiconductor memories are playing a vital role in today's digital world Each product should have defect free before marketing. The same way memory must be tested before applying it to any system design. Hence, memory testing is an essential one and it is a bit difficult to check its faults like struck at fault, address decoder fault and transition fault due to its complex design. An algorithm-based approach was applied to test the reconfigurable memory structure. MARCH is one of the best memory testing algorithms selected to diagnose the fault occurrence by repeated read-write operations. This paper focuses to check the faults in memory by Xilinx tool, compare various March algorithms for both Static Random Access Memory (SRAM) and Electrically Erasable Programmable Read Only Memory (EEPROM) setup to evaluate the performance to detect and identify the faults by developing python code.