Abstract
We report on the properties of submicrometer-sized Josephson tunnel junctions fabricatedin a cross-type technology. The quality of the junctions is indicated by current densityprofiles obtained from the Fraunhofer diffraction patterns. The capacitance of the junctionsis determined by the evaluation of Fiske steps. The strong improvement of SQUIDparameters, like the usable voltage swing and the intrinsic flux noise due to theuse of these low-capacitance Josephson tunnel junctions, is shown on SQUIDmagnetometers. In addition, a very high stability against magnetic fields of upto several mT during cooling down and unshielded operation is demonstrated.
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