Abstract
Abstract Sputtering yield and positive secondary ion intensity of Cu-Al alloys were measured under oxygen ion bombardment and ionization probability was determined as a function of alloy composition. It was found that the total sputtering yield fell below the straight line connecting the sputtering yields of pure elements and the modified ionization probability of Al in the consideration for the secondary oxygen ion intensity was constant and that of Cu varied linearly with the alloy composition.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.