Abstract
The paper presents the X-ray photoelectron spectra (XPS) of the valence band and core levels of the ferroelectric SbSI single crystal. Results revealed the new phenomenon--splitting of the core levels at the phase transition temperature T cl . The XPS are measured with monochromatized Al K f radiation in the energy range 0-1400 eV and the temperature range 130-330 K. Experimentally obtained energies are compared with the results of theoretical ab initio calculations. This is the first observation of the splitting of the XPS in a ferroelectric crystal. The mechanism of the XPS splitting in SbSI crystals is discussed.
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