Abstract
This article describes SPLAT II, a new aircraft compatible single particle mass spectrometer that provides significantly improved performance when compared with SPLAT, or any other existing single particle mass spectrometer. SPLAT II detects and characterizes 100% of spherical particles and ∼30% of aspherical particles with diameters between 125 nm and 600 nm. It also brings significant increase in temporal resolution, sizing over 500 particles per second, while characterizing the composition of up to 100 of them. The increase in sensitivity to small particles makes it possible, under most conditions, to use a differential mobility analyzer upfront SPLAT II in order to simultaneously measure in addition to individual particle size and composition, a number of other particle attributes, such as density or effective density, dynamic shape factor, fractal dimension, and even hygroscopicity. SPLAT II provides sizing precision on the order of a monolayer, and makes it possible to distinguish between spherical ...
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
