Abstract

A new technique has been developed which opens the way to magnetic imaging with nm resolution. A narrow electron beam produced with a scanning tunneling microscope operating in field emission mode impinges on the magnetic surface, and the spin polarization of the emitted secondary electrons is monitored. As a first result, a hysteresis loop from an Fe-based metallic glass shows that the low-energy secondary electrons excited with this technique are spin polarized.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.