Abstract
Abstract This chapter describes the enormous experimental progress in spin‐polarized scanning tunneling microscopy (SP‐STM), which allows magnetically sensitive imaging with ultra‐high resolution down to the atomic scale. The fundamentals of SP‐STM are introduced on the basis of planar tunnel junctions for different electrode materials being superconductors, optically excited GaAs and ferromagnets. It is shown that both ferromagnets and antiferromagnets are suitable tip materials for SP‐STM. Appropriate tip designs and modes of operations are discussed for both types of material. The results of recent laterally resolved measurements performed with different magnetic probe tips and different modes of operation are reviewed. In addition, the limits of this ultimate lateral resolution and the influence of an external magnetic field on the imaging process are discussed. The examples discussed range from bulk material to 2‐D systems such as surfaces, thin films and nanoparticles, and to 1‐D systems such as nanowires. The magnetic properties of individual atoms are also presented.
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