Abstract
The effect the thickness and concentration composition of a ferromagnetic thin film have on surface anisotropy constant K S is investigated. Spin–wave resonance is chosen as a way of detecting and measuring the K S value. Fe–Ni thin films are synthesized via chemical deposition. Dependences of K S on the content of Ni in the alloy and a film’s thickness are established.
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More From: Bulletin of the Russian Academy of Sciences: Physics
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