Abstract
Tunneling magnetoresistance (TMR) dependence on the Al2O3 barrier thickness was investigated for CoFe/Al2O3/CoFe magnetic tunnel junctions (MTJs). MTJs with very thin Al2O3 layers were grown by inserting an amorphous FeZr buffer layer whose role is only to reduce the roughness of bottom electrode. The TMR decreased as the thickness of the Al2O3 layer was reduced. The results are analyzed with the dependence of the spin-filtering effect on the Al2O3 thickness. It was found that a simple model of separating sp- and d-like electrons does not work, and it may suggest that the tunneling electrons are in rather hybridized state.
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