Abstract

A SPICE model for the MOS-gated Emitter Switched Thyristor (EST) structure is developed for the first time. This static model is based on analytical models developed through two-dimensional numerical simulations using PISCES. Using this model the complete static characteristics of the EST, including the IGBT region of operation can be described. The EST model implemented in SPICE shows good agreement between the model and measurements (600 V EST) for the forward voltage drop and the main thyristor latching current density as a function of the gate bias.

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