Abstract
In this work, several spectral techniques such as pulsed and steady-state photo-ionization spectroscopy, deep level transient spectroscopy and infra-red steady-state photoluminescence spectroscopy have been combined to reveal and clarify the prevailing defects in cadmium zinc telluride (CZT) materials and device structures. The room temperature measurements were routinely performed to correspond with operation conditions of the CZT devices. The spectra recorded by the contactless and contact techniques have been compared to clarify the role of defects residing in bulk and near-contact regions.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
