Abstract
Photoluminescence (PL) and electron paramagnetic resonance (EPR) are powerful techniques for both fundamental studies and potential materials screening of CdTe substrates for HgCdTe growth. Certain extended defects that are common in epitaxial CdTe have a distinctive PL signature that correlates with X-ray measurements of crystallinity. Bulk samples with prominent subgrain structure also have this PL feature, and cathodoluminescence images show that the defect is localized to the subgrain boundary regons. PL and EPR are very sensitive techniques, and specific impurities such as Fe or Ag have been observed in some nominally pure samples. PL and EPR spectroscopy can also detect changes associated with thermal annealing treatments, which alter the stoichiometry of CdTe by varying the number of Cd vacancies and interstitials. These findings illustrate the versatility of PL and EPR as nondestructive techniques to assess the quality of substrates for IR-detector materials.
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