Abstract
AbstractThe results of the application of the spectroscopic phase modulated ellipsometry (SPME) to a series of novel ternary compounds from anisotropic to polycrystalline are presented to show the high effectiveness of this optical technique with regard to the dielectric function of the new materials. Besides, SPME in specular reflection mode to study the polarization degree of the light reflected at specular angle is shown to be very informative in determination of the best conditions for optical measurements on rough surfaces such as, for example, surfaces of the polycrystalline ternary thiogallate compounds studied in this work. An incoherent approach relating the measured depolarization with the surface variance and optical constants of a material or thin film is proposed. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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