Abstract
A spectroscopic Mueller matrix polarimeter based on spectro-temporal modulation with a compact, low-cost, and birefringent crystal-based configuration has been developed. The polarization state generator and polarization state analyzer in the system consists of a polarizer in front of two high-order retarders with equal thickness and a rotating achromatic quarter wave-plate followed by a fixed analyzer, respectively. It can acquire the 16 spectroscopic elements of the Mueller matrix in broadband with a faster measurement speed than that of the conventional spectroscopic Mueller matrix polarimeter based on a dual-rotating retarder. In addition, the spectral polarization modulation provided by the polarization state generator can produce five separate channels in the Fourier domain, which leads to a larger bandwidth of each channel than that of the existing spectral modulated spectroscopic Mueller matrix polarimeters. Experiment on the measurements of an achromatic quarter-wave plate oriented at different azimuths and SiO2 thin films deposited on silicon wafers with different thicknesses are carried out to show the feasibility of the developed spectroscopic Mueller matrix polarimeter.
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