Spectroscopic Measurements on a Plasma-Filled Paraxial X-Ray Radiography Diode

Abstract

Summary form only given. Spectroscopic experiments are being conducted on a plasma-filled paraxial X-ray radiography diode on the RITS-3 accelerator at Sandia National Laboratories. Initial data shows line and continuum emission occurring during the time of the electron beam propagation through a partially-ionized background plasma. Additional impurity ion species have also been identified. The purpose of these studies is to understand how a 4-4.5 MeV electron beam interacts with a background plasma as compared to a neutral gas, and the effects this has on beam focusing, instability formation, and X-ray production. By studying selected lines, plasma parameters such as charge states, densities, and temperatures can be obtained. Diagnostics include a gated, intensified microchannel plate camera with a 1 meter Czerny-Turner monochromator, giving a temporal evolution of a few nanoseconds. This is combined with a multi-fiber spectral input, which allows for spatial resolution in two dimensions in front of the target surface. Studies of this type are important for X-ray radiography diode research and help to support modeling efforts and to ensure future predictive capabilities