Abstract

Highly intense blue photoluminescence emission was observed from Dy doped ZnO thin films prepared by RF magnetron sputtering technique at a substrate temperature of 500 °C on to quartz substrate. X-ray diffraction (XRD) and the Raman spectra for the as deposited and Dy incorporated ZnO thin films suggest that the thin films are polycrystalline with a hexagonal wurtzite structure. The Raman spectra further indicates that the Dy doped ZnO films show bi-axial compressive stress. The average grain size calculated from the XRD and AFM images show that the densely distributed particles are in the nano dimension. All the films exhibit very good transmittance in the visible and near infrared region. The 1 % Dy doped ZnO film gives a low dc resistivity of 1.063 × 10−5 Ωm. The dc electrical resistivity and good emission properties enable these films to be used as good conductive thin film phosphors for low voltage field emission display applications.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.