Spectroscopic imaging ellipsometry of wood fiber cell wells: a comparison with confocal microscopy

Abstract

Spectroscopic imaging ellipsometry (SIE) permits real-time measurement of the path difference (PD) of single, intact wood fibers, a parameter proportional to the cell wall thickness. This new technique was used to measure fibers for their path difference (PD). Previously, the fibers’ cell wall thicknesses were measured by using confocal laser scanning microscopy (CLSM). The PD results were compared with the reference values of CLSM and are in reasonably good agreement with each other.