Abstract
Spectroscopic ellipsometry measurements of the complex dielectric function of a series of Cd1-xMnxTe (0 ≤x ≤0.7) films grown on (100) GaAs by hot wall epitaxy have been performed in the 1.5–5.5 eV photon energy range at room temperature. The measured data were analyzed by fitting the second-derivative spectra (d2ε/dω2) with a theoretical model, namely, the standard critical-point (SCP) line shapes. It was found that the SCP model explains the measured derivative spectra successfully. The composition dependence of the critical-point (CP) energies and Lorentzian broadening (Γ) was determined.
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