Abstract
We introduce a method for imaging defective structures in an array of magnetic nanodevices using ferromagnetic resonance force microscopy with contrast between normal and defective devices provided through differences in resonance condition. In a demonstration of this technique, two dimensional scans of an array resolve not only intentional differences in resonant field between 200 nm circular dots and an intentional oval “defect,” but also smaller differences between the nominally identical circular dots in the array.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
