Abstract
The method of measurement of low loss glasses by the comparison of the transmission through two samples of different length requires that the difference in reflection losses between samples be known. It has been shown that polished glass develops a surface layer with optical properties different to the bulk. Ellipsometry is used to assess the surface properties. This paper describes the development of an ellipsometer which has the refinements necessary for such measurements where small absolute ellipticities from low reflectance surfaces are observed. Discussion of the experimental procedure and precautions are included.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
