Abstract
The image forming process in a CdTe detector is both a function of the X-ray interaction in the material, including scattering and fluorescence, and the charge transport in the material [2]–[4]. The response of individual photons has been investigated using two pixellated CdTe image detectors with pixel pitches of 55μm and 110 μm. The detectors were bonded to TIMEPIX [5] readout chips and operated in time over threshold mode (To T). We have illuminated the sensors with monoengertic photons generated by X-ray fluorescence in metal sheets and with gamma photons from 241Am and 137Cs. Results shows a large degradation in energy resolution caused by charge sharing and fluorescence. By summing pixels together we can correct for the charge sharing and some, but not all fluorescence.
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