Abstract
The spectral phase noise of a cryogenically cooled Ti:Sapphire amplifier was analyzed by spectrally resolved interferometry. Since a relative phase difference measurement is performed, the effect of the amplifier stage can be determined with high precision. Contributions of the cooling system to the spectral phase noise were found to be below 50 mrad for both the vacuum pumps and the cryogenic system. The carrier-envelope phase noise of thermal and mechanical origin was also determined for different repetition rates of laser operation. Mechanical vibrational spectra were recorded by an accelerometer for different stages of operation and compared to the interferometric phase noise measurements.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
